Date: 05/12/2008 Product: TDSRT-Eye Serial Compliance and Analysis with SA - Serial Analysis Module IBA - InfiniBand Compliance Module PCE - PCI Express Compliance Module SST - SAS Compliance Module - SATA Compliance Module FBD - FB-DIMM Compliance Module Version: v3.1.1 (May 12, 2008) =============================================================== Contents of this Readme File: 1. System Requirements 2. Contents of Distribution 3. New Features 4. Release Notes 5. Known Problems 6. Installation 7. Contact Information =============================================================== 1. System Requirements - The TDSRT-Eye Application is intended for Tektronix oscilloscopes that support 4.0GHz or higher bandwidth, however the Serial Analysis module can be used on systems with a bandwidth as low as 1.5GHz. The optional PCI Express (opt. PCE) and Infiniband (opt. IBA) compliance modules operate on 4.0GHz systems, e.g., TDS6404, TDS6604, TDS6604B, TDS6804B, TDS6124C, TDS6154C, TDS7404/B, TDS7704/B, and CSA7404/B, and DPO/DSA70404, DPO/DSA70604, DPO/DSA70804, DPO/DSA71254, DPO/DSA71604, and DPO/DSA72004. The optional Fully Buffered DIMM compliance module (opt. FBD), Serial ATA (SATA) and Serial Attached SCSI (SAS) Analysis comp[liance modules (opt. SST) only operate on 6.0GHz or higher bandwidht systems, specifically the TDS6604, TDS6604B, TDS6804B, TDS6124C, TDS6154C, TDS7704B, DPO/DSA70604, DPO/DSA70804, DPO/DSA71254, DPO/DSA71604, and DPO/DSA72004 instruments. - This product is intended for use on Windows 2000/Windows XP based instruments and requires target systems to have 1024MB of system memory if record lengths in excess of 4Mpt are to be analyzed. - Note that the recommended MS Windows(TM) task bar settings for running this application are: - Always on top = unchecked - Auto Hide = unchecked - Disk space requirements: 200 MB of free disk space is required to install and operate this application including all compliance modules. Less space is required if only a subset of the available modules is installed. - It may be necessary to configure file/folder properties to allow users privileges to create and write. Consult the appropriate Microsoft documentation for details. The following folders and their contents may need to be so configured: C:\Program Files\TekApplications\tdsrt-eye C:\TekApplications\tdsrt-eye - Sun Microsystem's Java Runtime Environment (JRE) version 1.4.2_04 is required for this release and is automatically installed with the application. - P7330, P7350/SMA, P7380/SMA, P7313 differential probes, P7260 single ended probes, and P7500 family of TriMode active probes are intended as the principal interface to the device under test for this analysis tool. The user should ensure that the probing configuration selected in this tool matches their physical setup. P7380/P7380SMA/P7313 differential probes and P7500 series Tri-Mode active probes and direct SMA/SMA or SMA/SMP cable connections are the principal interface to the device under test for FB-DIMM/SAS/SATA testing. - Refer to the TDSRT-Eye online help for more requirements. =============================================================== 2. Contents of Distribution - TDSRT-Eye v3.1.1 Serial Compliance and Analysis Software (opt. RTE) - PCE v3.1.0 PCI Express compliance Module (opt. PCE, requires RTE) - IBA v3.1.0 InfiniBand compliance Module (opt. IBA, requires RTE) - SATA v3.1.0 Serial ATA compliance Module (opt. SST, requires RTE) - SAS v3.1.0 Serial Attached SCSI compliance Module (opt. SST, requires RTE) - FB-DIMM v3.1.0 Fully-Buffered DIMM compliance Module (opt. FB-DIMM, requires RTE) - Tektronix Report Generation Tools (Serial Analysis, IBA, PCI, SAS, SATA and FB-DIMM templates and layouts included above - MATLAB(TM) Release 13 RunTime Server - SUN JAVA(TM) Runtime Engine version 1.4.2_04 =============================================================== 3. New Features 05/12/2008 (V3.1.1) - Serial Analysis Module (SA): 1. A problem with parameters being passed to MATLAB was corrected in the ISD check. 08/24/2007 (V3.1.0) - Serial Analysis Module (SA): 1. Math has been added as an available measurement source in for differential probe type. 2. Improved handling of undersampled waveform data. 3. Improved the Remote Autoset commands for PCE, FBD, IBA, SAS and SATA modules. 4. Changing from Single Ended to Differential probe type automatically disables any selected plot mask to avoid incorrect pass/fail testing. 5. Improved high performance 'eye' rendering which gives more accurate worst case jitter. 6. Improved binary waveform read operations for file based input. 7. Improved and expanded Statndards Support Library: Library now includes mask, limit, and setup(.ini) files for several technologies such as Display Port, OBSAI, Ethernet, Rapid IO, XAUI CX4, etc. Additional details are provided in the on-line help and later in this readme file. - PCI-Express Module (PCE): 1. A dialog box was added for SigTest support that allows presetting the appropiate sample rate values for DPO/DSA and TDS oscilloscope waveform files: 50GSa/s for DPO/DSA, and 40GSa/s for TDS oscilloscopes. Additional details are provided in the on-line help text, with complete instructions for entering the sample rate and data file path used by SigTest. 2. Reference Clock testing is enabled only when PCI-E v1.1 testing is selected. It is disabled when PCI-E v1.0 and v2.0 testing is selected. 3. The Eye Height measurement algorithm was changed to use equation: EyeHeight=(Vtop-Vbase) Earlier releases used the PCI-E equation EyeHeight=2*min(abs(Vtop - Vref),abs(Vbase - Vref)). The original equation could yield unexpected results on waveforms with significant common mode or DC offset. 4. Improved mask violation tracking and detection results in fewer false mask hits in marginal waveforms. - Serial ATA Module (SST): 1. Improved Risetime and Falltime calculation and reportings. - Applicable to ALL modules: 1. Waveform plots of transition & non-transition bit eye diagrams are now automatically stored as JPEG format binary images (.jpg) and can be copied from the folder C:\TekApplications\tdsrt-eye\images. 2. An issue resulting in old report data being reused in current reports has been resolved. Old report data are cleared prior to new report generation. Due to the available file system performance settings in Microsoft Windows, caching of file data can occasionally leave unexpected remnants (cases are suspected where the delete command executes prior to the when OS actually flushes write data to disk and a "file not found" error occurs), therefore users are also advised to occasionally examine and delete files in the C:\temp folder. 3. Report generator templates updated for PCIE and SATA differential amplitude measurements. - 01/12/2007 (V3.0.2) Added support for 12.5GHz, 16GHz and 20GHz DPO/DSA oscilloscopes. Provides improvements in SATA Amplitude measurements. Provides increased range for clock recovery PLL damping ratio: upper limit is increased to 2.0. Provides Report Generator Install Dialog improvements. Updates to PCE module PCI Express reference clock, data measurements, and limits testing. Updates to FBD module FB-DIMM TxLrg3.5dBDIMM and TxLrg6.0dBDIMM test point files. - 09/07 (V3.0.1) Corrected issues with SATA measurements and PCI-Express / Infiniband modules. - 07/06 (V3.0.0) Added support for DPO and DSA oscilloscopes. - 06/06 (V2.0.5) Resolved several defects in SATA (SST), PCIE (PCE) and FB-DIMM (FBD) modules. - 02/06 (V2.0.2) Added N-Period measurement (per SATA 1.0) to the SATA (SST) module. Improved the clock recovery algorithms. - 10/05 (v2.0.1) Resolved a reference clock jitter measurement issue in the PCI-Express (PCE) and FB-DIMM (FBD) modules. - 08/05 (v2.0.0) New FB-DIMM module introduced, covering fully buffered DIMM module data rates of 3.2, 4.0, and 4.8Gb/s. Major updates to PCE module to address updates to PCI-Express Rev 1.0a, Rev 1.1, and Rev 2 (latest) standards. Added filtered reference clock measurements to FB-DIMM (FBD) and PCI-Express (PCE) modules. Added integration of SigTest to FB-DIMM (FBD) and PCI-Express (PCE) modules. Added support to PCI-Express (PCE) module for new test points (Cable, Expansion Module, Mobile, etc.) Added Rj/Dj analysis of arbitrary patterns. Added Dual-Dirac Rj/Dj/Tj analysis added where required by standards. Added 3D color-graded eye rendering, with incremental update of eye. Enhanced clock recovery, including 1st-order PLL + nominal bitrate support. Added Set-up Wizard to provide step-by-step guidance for many tasks. Added MyTest feature for one-button access to custom measurements. Corrected issues with several Serial Attached SCSI masks. - 03/05 (v1.3.5) Minor enhancements to ensure that PDF versions of manuals start properly on all platforms. - 02/05 (v1.3.4) Resolved issues with incorrect SATA mask hits. Added Waveform Plot as option to Eye Diagram measurements. Trend plots were removed. - 09/04 (1.2.0) Added SATA and SAS modules (opt. SST). (The 5-time free trials is shared between the SATA and SAS modules.) - 06/04 Updated the PCI-Express masks to reflect a choice of System Board or Add-In card eye geometries. Corrected a rare initial bit estimation error on ultra low jitter signals. - 11/04 Added PCI-Express setup files for midbus connector for Serial Analysis module. Added XGA support. Added Explicit Autoset for InfiniBand and PCIExpress modules. The button appears on the Measurement Select area. Added RGPIB commands for Autoset: autosetIBA; autosetPCE; autosetFB-DIMM. Corrected PLL selections for IB module. =============================================================== 4. Release Notes - Beginning with Serial Analysis version 2.0.0, the setup file format has been revised. You may recall and use setup files from prior versions. In this case the application will use logical defaults for any control parameters not formerly present. You may wish to review the settings to verify that any new parameters are acceptable. You may then resave the setup file to the same name to permanently update it to the new format, or save it to a new name if you wish to retain the old setup file. The new file format is not backward compatible. - In compliance modules, only measurements for which the specification gives PASS/FAIL limits will appear in the Results>Summary panel. If you select additional measurements, results will only show up in the Results>Details panels. - The AC Common-Mode Voltage measurement has been changed from a peak to an RMS measurement. This change conforms with specification requirements. If a setup file from a prior version of RT-Eye contains an AC CM voltage measurement, the current RMS measurement will NOT be turned on during recall of the file. - This release of the RT-Eye application includes several minor improvements to areas such as PLL clock recovery, Rj/Dj separation, smart-gating boundary conditions and the calculation of reference levels. These may lead to small variations in measurement results between this version and prior versions, for identical waveforms. - FREE TRIALS * If you install the software for a module for which an option key has not been installed, you will have 5 free trials of that module. * In the case of the Serial Analysis module, a free trial will be consumed each time you launch the RT-Eye application. * In the case of the other (optional) modules, you may enter a module and explore its user interface at any time; the free trial will not be consumed until you either run an Autoset or a measurement. You may then run additional measurements; a new free trial will not be required unless you leave the module and re-enter it. * Since the SAS and SATA modules both use the same option (SST) and key, you are allowed a total of five free trials shared between these modules, e.g. two trials of SAS and three trials of SATA. =============================================================== 5. Known Issues General Notes: - Eye rendering of record lengths in excess of 4MPt place a large demand on system resources, incur large processing times, and should be avoided unless MATH is used as source, in which case 10Mpts is the recommended limit. However, all limitations related to record length may be disabled by creating a file called unlimitedRL.txt and placing it at C:\TekApplications\tdsrt-eye. (The filename is case-sensitive. The file itself can be empty.) If RT-Eye is launched after this file is created, no record-length limits will be enforced. Operation in this configuration is not supported. - When creating a custom eye mask, it must have exactly three segments defining the high (upper), middle (center), and low (lower) keep-out areas, and they must appear in that order. Consult supplied masks for examples. - The "Use Sigtest" feature in RT-Eye provides a mechanism to use the Sigtest software from within the PCI-Express or FB-DIMM modules. Some versions of Sigtest may include alpha or beta code. If the Sigtest utility becomes unresponsive, we recommend that you: A) Press the "Exit Sigtest" button provided in the RT-Eye application. B) Use the Windows Task Manager to end the "Sigtest.exe" process, if Step A is ineffective. 08/01/2007 - Serial Analysis(SA) Module: 1. The Display Port CTS specification/procedure is evolving and requires clarification on the EYE diagram mask coordinates and the limit files. The mask and limit files supplied currently are in accordance with Draft-6 and Draft-11 of CTS and Ver1.1 standard. The normalized eye concept is taken from Draft-6 and the eye coordinates are taken from Draft-11 of the CTS. There is also need for clarification on the Total Jitter value specified and eye-width in the CTS. As the CTS standard evolves, changes to the Display Port limit files and mask templates will be needed. Updates will be included in future releases of this application. 2. The oscilloscope setup files (.set) provided for various technologies such as Display Port, SAS(1.5, 3.0and 6.0G), FB-DIMM, IB, XAUI, Serial RIO, and OBSAI work with DPO/DSA series oscilloscopes. These setup files will not work with TDS oscilloscopes. Users working with TDS series oscilloscopes must manually create appropriate oscilloscope setups before using the standards library templates. 3. When recalling setup files (.ini and .set files) for each technology for the Serial Analysis module, reference levels are recalled that are near the expected signal levels. However these recalled values are static and are not ideal for all cases. It's strongly recommended users RUN a RefLevel autoset prior to sequencing tests. Running tests without autosetting RefLevels may result in errors and inaccurate measurement results. 4. Serial Analysis 'Summary' Status Panel may not show all measurement results shown on the detailed results panel. This is by design. Generally, only results required for complaince testing are included on the results summary. 5. In SA module the StandardsSupportLibrary.MOI.pd is not listed under HELP menu. However this PDF can be accessed from the Windows path (Start->Programs->TekApplications->TDSRT-Eye). 6. The Report Generator is selected from Utilities->Reports in the application and it can take some time (5-7 seconds) to come up. This is for the first time only and subsequent selection of the Report Generator is faster. 7. During the installation of both RT-EYE and Report Generator, you may receive a message indicating that Report Generator is not installed. If you have an existing version of Report Generator installed when this message appears, simply click OK to ignore the message. -InfiniBand (IBA) Module: 1. IBA module Autoset feature is ineffective if measurements are Disabled. - Serial ATA and SAS Module: 1. When performing compliance tests, always display units as "Seconds" to ensure conformance with SATA WG specs. When display units are "Unit Interval", the measured values and limits of measurements like Rise/Fall Time are calculated from the measured mean UI duration for each sequence. 2. We recommend that you perform Bit Rate measurement on HFTP (0101010101b) or Align pattern. Patterns that do not contain a bit sequence of '010' or '101' may cause incorrect clock recovery, leading to errors in Bit Rate, Eye Height/Width, and other measurements. 3. When the SATA input source is set for file, it is necessary to complete all the dialog steps otherwise the file name selection will not be reflected and the desired files will not be loaded correctly. Use the 'Browse' button to select the file name. Select and/or Edit the file name in the file path and always press ‘Enter' from the keyboard. Then press the dialog ‘Select’ button to confirm the change. 4. For SATA and SAS testing, it may be necessary to manually adjust the AWG settings as follows: * The SATA and SAS applications assume a 5X attenuator is placed between the AWG marker output and the device under test. The application automatically programs the AWG610 and AWG710 to the following levels: Marker High = 2.5V; Marker Low = 0.5V. This results in an output that switches between 0.5V and 0.1V single ended, or a differential output of 0.4V peak to peak. You may wish to manually adjust the AWG marker high to 2.0V and marker low to 0.0V. This will maintain the differential output of 0.4V while eliminating the 0.1V offset. * 2X attenuators are recommended for the AWG615 and AWG710B. You must manually set the AWG marker levels; we recommend Marker High = 0.8V and Marker Low = 0.0V. This results in an output that switches between 0.4V and 0.0V, or 0.4V differential. * The minimum voltage required to drive the Gen 2 and Gen 1 DUT's is 400mV. Manually adjust the AWG voltage levels as necessary for other SATA usage models. 5. For SATA measurements there is a known defect concerning the trigger level. The application automatically sets the trigger level to 1.44V. You must manually adjust the trigger level to 0.2V using the trigger adjustment knob on the front panel of the oscilloscope. - FBDIMM Module: 1. Autoset on TDS6604 scopes incorrectly sets the horizontal system to 1 usec and 50ps/point. It should be set to 2 usec and 50 ps/point. - NOTES ON FB-DIMM COMPLIANCE TESTING * The device under test should be preset into a test mode transmitting the compliance test pattern prior to making measurements. * In an FB-DIMM system you can have the blank DIMM (NEX-TDSFBDP) at the first slot (nearest to the memory controller) and test the signal, provided the system is transmitting the compliance pattern (IBIST pattern) typically using the Vendor Specific Memory Controller software or is in a test mode wherein the memory controller transmits the signal even in the absence of the AMB. In this case you will be testing the Memory Controller signals. The probing will be at the RX ball of our NEX-TDSFBDP blank DIMM. * If your customer FB-DIMM is to be tested , it should be in the first slot (nearest to the memory controller) and you need to have the NEX-TDSFBDP blank DIMM in the immediately adjacent Southbound slot. The DIMM under test should be transmitting the compliance pattern typically using the Vendor specific Memory Controller/AMB software. Here again you will test the DIMM Under Test signal at the RX ball of the NEX-TDSFBDP Blank DIMM. (It will be like testing the customer FB-DIMM TX signal at the RX point of the immediate south bound NEX-TDSFBDP blank DIMM.) Using the NEX-TDSFBDP you can test at the RX and Ref Clk test point and more so the Southbound traffic. * Customersusing TDSN4238B may use Intel’s DLB test fixture with FBD setup files to perform the compliance testing. - Applicable to all Modules: 1. When measuring eye height and other eye related measurements on a 101010 pattern yields error E424: "No edges or UI of required type found in waveform. If this is not a clock signal, check Vref threshold or record length". This error occurs any time an Eye Height measurement is made on data lacking clear transistion non-transition data. A similar error occurs when an eye diagram plot is configured for transition bits. 2. While using the programmatic interface (RGPIB) to control RT-EYE, the Visa Call Monitor can inadvertently lock the connection and cause the RT-EYE application to stop. It is strongly recommended that the Call Monitor be closed when using the programmatic interface. 3. The application input source has a restriction to the way file names are applied. The following keywords are reserved and should not be used in user supplied file names: “diff” and “cm”. These keywords are internally used by the application and using them in user file names will cause an E400 error. 4. If the trigger configuration in the scope is such that it does not trigger when you select the Start button, a blinking "Waiting for Trigger" will appear. You should verify that the scope trigger is correctly configured if this occurs for short record lengths. However, the blinking window will frequently appear when long records are processed, even though the scope has successfully triggered. In particuler, when the probe configuration is Single-Ended, the application will display the blinking window several times as it processes the Vpos, Vneg, and Vdiff waveforms. No corrective action is required in these cases. 5. If a measurement cycle is terminated using the RT-Eye Stop button because the scope has failed to trigger, it may take up to five minutes for the scope to time out and return to a usable state. It may be preferable to press the Run/Stop button on the scope in this case, which will cause RT-Eye to reprocess the waveform currently in memory. The results should be discarded for this measurement cycle. 6. If the sample rate of the oscilloscope is manually changed after an eye has been rendered, press the sequencer CLEAR results button before accumulating additional measurement or eye data. This will prevent non-similar eye data from being merged. 7. This analysis tool is extremely computation intensive and a heavy consumer of memory and disk resources. We recommend only necessary background applications be running at the same time as RT-Eye. 8. Population Limit Control Doesn't stop on Jitter @ BER measurements when control properties are set to acquisition. 9. Do not attempt to use applications to control TDSRT-Eye using the oscilloscope virtual GPIB interface (part of TekVISA). Concurrently running products on the oscilloscope, like the example LabVIEW and MATLAB programs included with the application distribution, will result in instrument communication failure and both the controller and oscilloscope environments will be left inoperative likely requiring a power cycle to recover. 10. To use disk based single-ended reference waveform files as inputs to TDSRT-Eye, it is recommended they be recalled into the instrument's reference waveform memory locations. Then select the appropriate REF memories as sources. 11. Exporting masks from the base instrument can result in either relative or absolute coordinate mask. At the present time, relative masks are not supported by RT-Eye and relative masks will require manual edits to be compatible. - Report Generator 1. Old report data are cleared prior to new report generation. But due to the available file system performance settings in Microsoft Windows, caching of file data can occasionally leave unexpected remnants (cases are suspected where the delete command executes prior to the when OS actually flushes write data to disk and a "file not found" error occurs), therefore users are also advised to occasionally examine and delete files in the C:\temp folder. In particular, if a popup error message "Cannot open C:\TEMP\TEK<#>.jpg" occurs during report generation, you should delete all .jpg files in the C:\temp directory and generate the report again. 2. Compliance reports can become fragmented during .rtf exporting when graphics, tables and result fields close to the right margin are used in the layout. The default templates provided with this product are left justified to work around this problem. 3. When a report that has been exported to RTF format is opened using Windows XP / Office XP, the Data in the Results Table will have small formatting changes and the images will be smaller than those seen in the original report. =============================================================== 6. Installation Normally, the TDSRT-Eye application resides on the hard drive of your oscilloscope. If the application is not installed on the hard disk perform the following steps to install the application from the Optional Applications Software on a Windows-Based Oscilloscope Compact disc (CD-ROM) - If a version of TDSRT-Eye prior to v2.0.0 is already installed on your oscilloscope, you must use Control Panel > Add/Remove Programs to uninstall RT-Eye Serial Compliance and Analysis. Select Change/Remove, choose the "Remove" option, follow the prompts to complete the removal, reboot the oscilloscope and then proceed with the v2.x installation. Do not use the "Repair" option. This procedure assumes the instrument is powered off. 1. A keyboard and mouse are recommended. If the keyboard and mouse are not installed, connect them to the oscilloscope rear panel. 2. Power on the oscilloscope to start Windows. When the instrument software is running, minimize the application. 3. Install the optional applications software CD in the CD-ROM reader of the oscilloscope. 4. The autorun utility will start the installation program. If the autorun utility doesn't start up automatically, browse to the CDROM and double- click the file 'launch.exe'. 5. Select the option 'Serial Data Compliance and Analysis'. 6. Select the option 'Install Now'. 7. Follow the instructions given by the InstallShield Wizard. If Java Run-time Environment (JRE 1.4.2_04) software is not previously installed then the InstallShield Wizard will prompt for installing it. Click "Yes". Do not change the default locations to install the files. The oscilloscope must reboot to complete the installation process. 8. You will need to enter the authorized Option Installation Key to enable the application. The key is specific to the serialized oscilloscope and options for which it was purchased. To enter the key number, follow these steps: a. If the oscilloscope powered on in the toolbar mode (default), select the Menu button (upper right corner of the display) to put the oscilloscope into menu-bar mode. In menu-bar mode you should see a PC-style menu across the top of the display. b. Go to the Utilities menu in the menu bar and select Option Installation. c. Follow the on-screen instructions to enter the alphanumeric key number exactly as it is printed on the rear-panel label. 9. RT-Eye(R) Serial Compliance and Analysis has a report generation feature. The Report Generator has its own installation package. This package was not found and could not verify if you have the latest version installed. Please visit http://www.tek.com/site/sw/search and enter Report Generator as your search item to download the latest installation package. The TDSRT-Eye application is now ready for use. Start the application through the oscilloscope menu selection: * App>RT-Eye Serial Compliance and Analysis (B/C series oscilloscopes) * File->Run Application->RT-Eye Serial Compliance and Analysis (all others) =============================================================== 7. Contact and Support Information - Telephone: Contact your North America Tektronix Representative at 1-800-833-9200 Sales support, select option 1 Service support, select option 2 Technical support, select option 3 For product support outside of North America, contact your local Tektronix sales office or distributor. - World Wide Web: http://www.tektronix.com/Measurement/scopes/home.html Click on "Software & Drivers" under the "Resources" set of links on the left. ---End of File---